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SN-VR-CT2 Series

(Summary description)<H1>Tape Testing Equipment</H1> <Span>Test Items: Defects Such As Printing, Presence Or Absence Of Material, Side-Turning Material, Chipping, Stitch Length, Poor Braid Sealing, Etc.</Span>

(Summary description)

<H1>Tape Testing Equipment</H1>
<Span>Test Items: Defects Such As Printing, Presence Or Absence Of Material, Side-Turning Material, Chipping, Stitch Length, Poor Braid Sealing, Etc.</Span>

Information

SN-VR-CT2 Series

Used In Wafers, Inductors, Crystal Oscillators, Chips And Other Products
Inspection Items: Defects Such As Dark Cracks, Chipping, Dirt, Missing Corners, Watermarks, Deformation, Shape (Length, Width, And Height), Etc.SN-VR-CT2 Series

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Relevant Information

Visual Intelligent Sorting Pipeline

Visual Intelligent Sorting Pipeline

Visual Intelligent Sorting Pipeline

Function: Check Appearance Defects, Size, Counting And Packaging, Packaging, Binning, Etc. Features: Highly automated, equipment can be customized according to different needs of customers. Products suitable for a wide range
Non-Standard Customized Equipment For Loading And Unloading Structure

Non-Standard Customized Equipment For Loading And Unloading Structure

Non-Standard Customized Equipment For Loading And Unloading Structure

This customer has been separately evaluated by a number of Taiwanese equipment. Sini Vision is recognized by customers as an automated vision company with inspection capabilities and non-standard R&D capabilities This customer entrusted Sini to customize visual inspection robots for EP, EE, and EF specifications.
SN-VR-C18 Series

SN-VR-C18 Series

High-Speed Testing Machine (Resistance Capacitor Series)

Function: Inspection Of Appearance Defects, Size, Counting And Packaging, Packaging, Binning, Etc. Test Items: Chipping Edges And Corners, Embossing Marks, Surface Damage, Surface Unevenness, Printing Marks, Printing Sagging, End Extension, End Black Spots, Impurities, End Oxidation, Localized Color Abnormalities And Other Defects
SN-VR-C12 Series

SN-VR-C12 Series

Apply to products such as chips, inductors, crystal oscillators, chips, etc.

Detection items: defects such as dark cracks, chipping, dirt, missing corners, watermarks, deformation, shape (length, width, and height), etc.

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