SN-VR-C12 Series
(Summary description)<h1>Apply to products such as chips, inductors, crystal oscillators, chips, etc.</h1>
<span>Detection items: defects such as dark cracks, chipping, dirt, missing corners, watermarks, deformation, shape (length, width, and height), etc.</span>
(Summary description)
<h1>Apply to products such as chips, inductors, crystal oscillators, chips, etc.</h1>
<span>Detection items: defects such as dark cracks, chipping, dirt, missing corners, watermarks, deformation, shape (length, width, and height), etc.</span>
Information
SN-VR-C12 Series
Used in wafers, inductors, crystal oscillators, chips and other products
Inspection items: defects such as dark cracks, chipping, dirt, missing corners, watermarks, deformation, shape (length, width, and height), etc.
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SN-VR-CT2 Series
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